On 24 June the 4th Semiconductor Metrology and Inspection Roundtable brought together around 35 experts from industry, research and technology at Park Innovaare.

Throughout the afternoon, the participants took matters into their own hands: they discussed the most pressing hurdles in semiconductor metrology, forged new connections, and actively contributed to a Swiss innovation roadmap. Their shared goal: finding out how industry and research can work hand in hand to achieve the greatest leverage for Switzerland as a technology hub.

We are proud that Park Innovaare can serve as a place where these connections happen and where the future of semiconductor innovation is shaped together. A special thank you to the to all the participants, for driving this initiative and creating a platform where ideas can evolve into concrete collaborations.

📸 A few impressions from the roundtable.